In my previous blog, Using Data to Drive Plant Productivity, I categorized reasons for downtime in the plant and also discussed how data from devices and sensors could be useful in boosting productivity on the plant floor. In this blog, I will focus on where this data is and how to access it. I also touched on the topic of standardizing interfaces to help boost productivity – I will discuss this topic in my future blog.
Sensor technology has made significant progress in last two decades. The traditional transistor technology that my generation learned about is long gone. Almost every sensor now has at least one microchip and possibly even MEMs chips that allow the sensor to know an abundance of data about itself and the environment it which it resides. When we use these ultra-talented sensors only for simple signal communication, to understand presence/absence of objects, or to get measurements in traditional analog values (0-20mA, 0-10V, +5/-5V and so on), we are doing disservice to these sensors as well as keeping our machines from progressing and competing at higher levels. It is almost like choking the throat of the sensor and not letting it speak up.
To elaborate on my point, let’s take following two examples: First, a pressure sensor that is communicating 4-20mA signal to indicate pressure value. Now, that sensor can not only read pressure value but, more than likely, it can also register the ambient temperatures and vibrations. Although, the sensor is capable of understanding these other parameters, there is no way for it to communicate that information to the higher level controller. Due to this lack of ambient information, we may not be able to prevent some eminent failures. This is because of the choice of communication technology we selected – i.e. analog signal communication.
For the second example, let us take a simple photoeye sensor that only communicates presence/absence through discrete input and 0/1 signal. This photoeye also understands its environment and other more critical information that is directly related to its functionality, such as information about its photoelectric lens. The sensor is capable of measuring the intensity of re-emitted light, because based on that light intensity it is determining presence or absence of objects. If the lens becomes cloudy or the alignment of the reflector changes, it directly impacts the remitted light intensity and leads to sensor failure. Due to the choice of digital communication, there is no way for the sensor to inform the higher level control of this situation and the operator only learns of it when the failure happens.
If a data communication technology, such as IO-Link, was used in these scenarios instead of signal communication, we could unleash these sensors to provide useful information about themselves as well as about their environment. If we collect this data or set alerts in the sensor for the upper/lower limits on this type of information, the maintenance teams would know in advance about the possible failures and prevent these failures to avoid eminent downtime.
Collecting this data at appropriate frequencies could help build a more relevant database and demonstrate patterns for the next generation of machine learning and predictive maintenance initiatives. This would be data driven continuous improvement to prevent failures and boost productivity.
The information collected from sensors and devices – so called smart devices – not only helps end users of automation to boost their plant’s productivity, but also helps machine builders to better understand their own machine usage and behaviors. Increased knowledge improves the designs for the next generation of machines.
If we utilized these smart sensors and devices at our change points in the machine, it would help fully or partially automate the product change-overs. With IO-Link as a technology, these sensors can be reconfigured and re-purposed for different applications without needing different sensors or manual tunings.
IO-Link technology has a built in feature called “automatic parameterization” that helps reduce plant down-time when sensors need replaced. This feature stores IO-Link devices’ configuration on the master port as well as all the configuration is also persistent in the sensor. Replacement is as simple as connecting the new sensor of the same type, and the IO-Link master downloads all the parameters and replacement is complete.
- IO-Link unleashes a sensor’s potential to provide information about its condition as well as the ambient conditions, enabling condition monitoring, predictive maintenance and machine learning.
- IO-Link offers remote configuration of devices, enabling quick and automated change overs on the production line for different batches, reducing change over times and boosting plant productivity.
- IO-Link’s automatic parameterization feature simplifies device replacement, reducing unplanned down-time.
Hope this helps boost productivity of your plant!